ANL series

High Energy and High Repetition Rate DPSS Nanosecond Amplifier systems
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  • Up to 2 J at 1064 nm output pulse energy
  • Up to 1 kHz repetition rate
  • Multi-channel version providing up to 8 channels and 2 J per channel at 1064 nm
  • Pulse durations from 2 ns to 50 ns
  • Spatial Super-Gaussian beam profile
  • Low maintenance cost and long diode lifetime
  • Up to 2 J at 1064 nm output pulse energy
  • Up to 1 kHz repetition rate
  • Multi-channel version providing up to 8 channels and 2 J per channel at 1064 nm
  • Pulse durations from 2 ns to 50 ns
  • Spatial Super-Gaussian beam profile
  • Low maintenance cost and long diode lifetime

Features

Features

  • Burst version providing bursts of 20 kHz every 20 s
  • Variable pulse duration and temporal pulse shape control (AWG) option available
  • Various customization possibilities to tailor for specific application
  • Optional thermally stabilized second and third harmonics generators
  • High efficiency diode pumping chambers
  • Small laser head footprint and OEM integration upon request
  • Internal system diagnostics
  • Thermally induced birefringence compensation for high pulse repetition rates
  • Integrated vacuum system for image translation for smooth Super-Gaussian beam profile
  • Optional industrial grade, portable laser housing with integrated power supplies and cooling units

Applications

  • Thomson Scattering

Description

ANL series electro-optically Q-switched nanosecond Nd:YAG amplifier systems deliver high energy pulses at high repetition rates.

A diode-pumped Q-switched nanosecond laser, based on industry-tested technology is used as a master oscillator of the system. It produces high-intensity, high-brightness pulses and is well suited for further amplification in linear amplifiers for high-energy Super-Gaussian output pulses. Employing electro-optical cavity dumping, the master oscillator can produce pulses which are as short as several ns with uniform beam profile and low divergence.

Alternatively customers own seed source can be implemented as master oscillator and amplified to required energy level for further amplification in main power amplifiers.

Power amplifiers are a chain of low-maintenance diode-pumped single and double pass amplifiers where pulses are amplified up to the required energy. During amplification, spatial beam shaping is employed in order to get a flat top shape at the output. Optional second and third harmonic generators are based on angle-tuned nonlinear crystals placed in heaters.

For convenience, PC software for Windows™ is used for laser operation, monitoring and internal system diagnostics.

To tailor the laser for specific applications or requirements, various customization possibilities are available such as industrial grade, portable laser housing with integrated power supplies and cooling units; customer’s seed integration; multi-channel outputs; burst amplification and various other.

Specifications

ModelANL2001kANL4001kANL1k200ANL2k20k-Burst ANL2k100-SH
MAIN SPECIFICATIONS 1)
Pulse energy
    at 1064 nm> 200 mJ> 400 mJ> 1000 mJ2000 mJ2 × 1700 mJ
    at 532 nm 2) 2 × 900 mJ
Pulse energy stability (StdDev): 3)
    at 1064 nm1.5 %1.0 %
    at 532 nm2.0 %
Power drift 4)± 2 %
Pulse duration 5)2 – 4 ns~ 5 ns5 ns50 ns
Repetition rate1000 Hz200 Hzbursts of 20 kHz every 20 s100 Hz
Polarization at 1064 nmhorizontalvertical, > 90 %
Optical pulse jitter 6)< 30 ps
Linewidth< 1 cm-1
Beam profile Hat-Top (at laser output), without diffraction rings
Typical beam diameter 7)~6 mm~10 mm~12 mm~10 mm
Beam divergence 8) < 1.0 mrad < 0.5 mrad
Beam pointing stability± 30 µrad 3)± 50 µrad
PHYSICAL CHARACTERISTICS
Laser head (W × L × H)1000 × 2000 × 490 mm1000 × 2000 × 400 mm1000 × 2000 × 1800 mm
Power supply unit (W × L × H)553 × 600 × 700 mm550 × 600 × 500 mm
Umbilical length2.5 m3 m
OPERATING REQUIREMENTS
Facility water consumption (max 20° C)10 l/min14 l/min10 l/min8 l/min 20 l/min
Ambient temperature 22 ± 2 °C
Relative humidity 20 – 80 % (non-condensing)
Power requirements 9)208, 380 or 400 V AC, three phases, 50/60 Hz
Power consumption <10 kW<12 kW<6 kW2.0 kW9.4 kW
  1. Due to continuous improvement, all specifications subject to change without notice. Parameters marked typical may vary with each unit we manufacture.Unless stated otherwise, all specifications are measured at 1064 nm and for basic system without options.
  2. For ANLxxx-SH harmonic generator option. Harmonic outputs are not simultaneous; only single wavelength beam is present at the output at once.
  3. Standard deviation value averaged over 30 s after 20 minutes of warm-up.
  4. Deviation from average value measured over 8 hours of operation when room temperature variation is less than ±2 °C.
  5. Measured with photodiode with 100 ps rise time and oscilloscope with 600 MHz bandwidth.
  6. Standard deviation value, measured with respect to triggering pulse.
  7. Beam diameter is measured at 1064 nm at laser output at the 1/e² level and can vary with each unit we manufacture.
  8. Full angle measured at the 1/e² level at 1064 nm.
  9. Voltage fluctuations allowed are +10 % / -15 % from nominal value. Mains voltage should be specified when ordering.

Performance

Publications

Found total :
2 articles, 2 selected
Application selected :
All Applications
All Applications
Scientific Applications
High Intensity Sources – laser produced plasma, x-ray source
Thomson Scattering – elastic scattering of electromagnetic radiation by a free charged particle

Characterization and calibration of the Thomson scattering diagnostic suite for the C-2W field-reversed configuration experiment

Related applications:  High Intensity Sources Thomson Scattering

Authors:  A. Ottaviano, T. M. Schindler, K. Zhai, E. Parke, E. Granstedt, M. C. Thompson and the TAE Team

The new C-2W Thomson scattering (TS) diagnostic consists of two individual subsystems for monitoring electron temperature (Te) and density (ne): one system in the central region is currently operational, and the second system is being commissioned to monitor the open field line region. Validating the performance of the TS’s custom designed system components and unique calibration of the detection system and diagnostic as a whole is crucial to obtaining high precision Te and ne profiles of C-2W’s plasma. The major components include a diode-pumped Nd:YAG laser which produces 35 pulses at up to 20 kHz, uniquely designed collection lenses with a fast numerical aperture, and uniquely designed polychromators with filters sets to optimize a Te ranging from 10 eV to 2 keV. This paper describes the design principles and techniques used to characterize the main components of the TS diagnostic on C-2W, as well as the results of Rayleigh scattering calibrations performed for the whole system response.

Published: 2018.   Source: Review of Scientific Instruments 89, 10C120 (2018)

Thomson scattering systems on C-2W field-reversed configuration plasma experiment

Related applications:  High Intensity Sources Thomson Scattering

Authors:  K. Zhai, T. Schindler, A. Ottaviano, H. Zhang, D. Fallah, J. Wells, E. Parke, M. C. Thompson and the TAE Team

TAE Technologies’ newly constructed C-2W experiment aims to improve the ion and electron temperature in a sustained field-reversed configuration plasma. A suite of Thomson scattering systems has been designed and constructed for electron temperature and density profile measurements. The systems are designed for electron densities of 1×1012 cm-3 to 2×1014 cm-3 and temperature ranges from 10 eV to 2 keV. The central system will provide profile measurements of Te and ne at 16 radial locations from r = -9 cm to r = 64 cm with a temporal resolution of 20 kHz for 4 pulses or 1 kHz for 30 pulses. The jet system will provide profile measurements of Te and ne at 5 radial locations in the open field region from r = -5 cm to r = 15 cm with a temporal resolution of 100 Hz. The central system and its components have been characterized, calibrated, installed and commissioned. A maximum-likelihood algorithm has been applied for data processing and analysis.

Published: 2018.   Source: Review of Scientific Instruments 89, 10C118 (2018)

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