- Wide spectral range up to 4.5 THz
- High dynamic range >70 dB at 0.4 THz
- Real-time data acquisition up to 10 spectra/s
- Excellent spectral resolution better than 2.5 GHz
- “No bearing” design of fast delay line – virtually unlimited lifetime
- Transmission and reflection modes
- High spatial resolution THz imaging
- Complete PC control
- User-friendly software
- Chemical material characterization
- Carrier lifetime and mobility in semiconductors
- Dielectric properties and complex refractive index
- Metamaterials investigation
- Medical and biological nondestructive research
- Thickness measurements
Real-time Terahertz Spectrometer offered by Ekspla is a powerful tool for investigative applications of pulsed terahertz waves. With simple and robust design, it is easy-to-use and adaptable to individual requirements. The unique design of microstrip photoconductive antenna fabricated on low-temperature grown GaAs substrate ensures broadband spectral coverage and high dynamic range. The system is designed with two delay lines: fast and slow. Fast scan line allows real time data acquisition with 10 spectra/s speed and 110 ps time window. Average of collected spectra can increase dynamic range to 70 dB at pulse maximum and extend spectral range up to 4.5 THz. Additional slow delay line allows combination of multiple time windows; thus spectrometer obtains excellent spectral resolution < 2.5 GHz. The fast scan line is designed without bearings and uses a magnetically coupled drive which makes it extremely reliable and significantly extends the lifetime. T-SPEC spectrometer has hermetic housing with mounted gas inlets.
It can be used as purging box, when experiment requires special environmental conditions, like nitrogen or dried air. The spacious sample area allows easy integration of additional equipment, like cryostat of heater. On a special demand we can provide the integration of such equipment, ensuring good fit, spectrometer box sealing, vibration isolation and operation automation. Spectrometer is equipped with two standard spectroscopy modules for transmission and reflection configurations. Each module contains motorized sample manipulator. This allows measurements of multiple samples one by one, without physical access to the spectrometer. Reflection module has convenient vertical architecture, where THz beams reaches the sample from bottom and reflects backwards. The measured samples can be replaced quickly just by laying them down on the sample holder. No adjustment is needed either when changing samples or when changing modules.
Our T-SPEC series spectrometer is the perfect choice for broadband THz imaging. It allows scan of up to 25×25 mm sample with spatial resolution of approx. 1 mm. Measurements contain information about the target, revealing both structural and spectroscopic information.